Vinod Chopra

US Patent:

7376478, May 20, 2008

Filed:

Mar 21, 2006

Appl. No.:

11/385617

Inventors:

Vinod Kumar Chopra - Lake Barrington IL, US

Assignee:

Siemens Medical Solutions USA, Inc. - Malvern PA

International Classification:

G06F 19/00
G06F 11/30

US Classification:

700 97, 700106, 702182

Abstract:

A method to achieve perceived reliability for repairable systems including goal setting of different phases of the product life cycle. The method includes consideration of a plurality of product life cycle phases to determine a plurality of failure rate multipliers which are transformed to mean time between failures multipliers and normalized. Using these computed mean times between failures multipliers and a chosen level of customer use, the box-of-parts required mean time between failures level can be calculated. Also, the required mean time between failures for design, manufacturing, infant mortality, and service phase of product life cycle can be computed.

US Patent:

42531543, Feb 24, 1981

Filed:

Jan 11, 1979

Appl. No.:

6/002621

Inventors:

John C. Russ - Palatine IL
Robert Carey - Asten, NL
Vinod K. Chopra - Vernon Hills IL

Assignee:

North American Philips Corporation - New York NY

International Classification:

G06F 1520

US Classification:

364527

Abstract:

An improved method and apparatus for obtaining and displaying SEM X-ray line scans and maps for data collection and presentation in energy dispersive X-ray analysis of materials, having ratemeter circuitry providing a voltage output proportional to the intensity of detected pulses in an energy window and an absolute digital representation of the intensity count rate both corrected for dead time, input multiplexing and multiple output buffering of the ratemeter to accomodate multiple channel signals, a feedback loop from said ratemeter to provide display image enhancement, inhibit circuitry to eliminate background signals, signal averging circuitry to permit storage of multiple line scan of multiple single channel analyser outputs in a multi-channel analyser for later processing and display circuitry for displaying stored line scans.