Thomas J Pelc

US Patent:

8116044, Feb 14, 2012

Filed:

Dec 14, 2009

Appl. No.:

12/636910

Inventors:

Thomas J. Pelc - Newark CA, US

Assignee:

Oracle America, Inc. - Redwood Shores CA

International Classification:

H02H 7/16
H01G 2/12

US Classification:

361 15

Abstract:

Some embodiments of the present invention provide a system that facilitates the operation of a supercapacitor. During operation, the system measures an electrical parameter of the supercapacitor using a set of conductor rings surrounding a capacitor seal of the supercapacitor. Next, the system determines the presence of a leak in the supercapacitor based on the electrical parameter. Finally, the system manages the operation of the supercapacitor based on the presence of the leak.

US Patent:

20100155106, Jun 24, 2010

Filed:

Dec 22, 2008

Appl. No.:

12/341783

Inventors:

James David Britton - El Paso TX, US
Thomas J. Pelc - Newark CA, US

Assignee:

Sun Microsystems, Inc. - Santa Clara CA

International Classification:

H05K 1/02
H05K 3/22

US Classification:

174250, 29829

Abstract:

Implementations of the present invention may involve methods for providing an optical differentiation on a printed circuit board to assist in identifying a missing or improperly mounted component. The optical differentiation may be such that, when a component of the board is missing or improperly attached to the board, a distinct optical difference is created on the board in the visible or non-visible spectrum. Several implementations may create a visible color difference, a non-visible mark, a recognizable shape, texture change, cross hatching or other form of physical modification beneath the component or on the printed circuit board. Other implementations may include the optical differentiation within a silk-screen of the board or on an internal layer of the board.

US Patent:

61956139, Feb 27, 2001

Filed:

Sep 8, 1998

Appl. No.:

9/149164

Inventors:

Tanmoy Roy - Mountain View CA
Larry D. Smith - San Jose CA
Raymond E. Anderson - Santa Cruz CA
Thomas J. Pelc - Fremont CA
Douglas W. Forehand - Mountain View CA

Assignee:

Sun Microsystems, Inc. - Palo Alto CA

International Classification:

G01R 2700
H01G 4228

US Classification:

702 65

Abstract:

A system and method for measuring the equivalent series resistance (ESR) of one or more capacitors using an impedance analyzer, whereby the capacitors are joined to the impedance analyzer with a conductive adhesive. The conductive adhesive may advantageously provide for an electrically and mechanically stable connection between the capacitor and the remainder of the electrical circuit used to measure the ESR of the capacitor. The conductive adhesive may include heat activated or cold solder, or conductive putty. The system comprises a measuring unit for sweeping a frequency range to find the minimum impedance for the capacitor and a connector assembly for holding the capacitor in an electrically and mechanically stable connection using the conductive adhesive. The connector assembly includes a mating portion adapted for electrically connecting the connector assembly to an I/O port of the measuring unit and a terminal portion that accommodates a connection to the capacitor using the conductive adhesive. The method comprises connecting a mating portion of the connector assembly to the impedance analyzer.