Zhong S He

US Patent:

7411197, Aug 12, 2008

Filed:

Sep 30, 2005

Appl. No.:

11/240404

Inventors:

Zhong He - Ann Arbor MI, US
Feng Zhang - Ypsilanti MI, US

Assignee:

The Regents of the University of Michigan - Ann Arbor MI

International Classification:

G01T 1/24

US Classification:

25037001, 250389

Abstract:

Disclosed herein is a method of determining a characteristic of radiation detected by a radiation detector via a multiple-pixel event having a plurality of radiation interactions. The method includes determining a cathode-to-anode signal ratio for a selected interaction of the plurality of radiation interactions based on electron drift time data for the selected interaction, and determining the radiation characteristic for the multiple-pixel event based on both the cathode-to-anode signal ratio and the electron drift time data. In some embodiments, the method further includes determining a correction factor for the radiation characteristic based on an interaction depth of the plurality of radiation interactions, a lateral distance between the selected interaction and a further interaction of the plurality of radiation interactions, and the lateral positioning of the plurality of radiation interactions.

US Patent:

7692155, Apr 6, 2010

Filed:

Aug 12, 2008

Appl. No.:

12/190385

Inventors:

Zhong He - Ann Arbor MI, US
Feng Zhang - Ann Arbor MI, US

Assignee:

The Regents of the University of Michigan - Ann Arbor MI

International Classification:

G01T 1/24

US Classification:

25037001

Abstract:

Disclosed herein is a method of determining a characteristic of radiation detected by a radiation detector via a multiple-pixel event having a plurality of radiation interactions. The method includes determining a cathode-to-anode signal ratio for a selected interaction of the plurality of radiation interactions based on electron drift time data for the selected interaction, and determining the radiation characteristic for the multiple-pixel event based on both the cathode-to-anode signal ratio and the electron drift time data. In some embodiments, the method further includes determining a correction factor for the radiation characteristic based on an interaction depth of the plurality of radiation interactions, a lateral distance between the selected interaction and a further interaction of the plurality of radiation interactions, and the lateral positioning of the plurality of radiation interactions.

US Patent:

57773386, Jul 7, 1998

Filed:

Dec 11, 1996

Appl. No.:

8/763675

Inventors:

Zhong He - Ann Arbor MI

Assignee:

Regents of the University of Michigan - Ann Arbor MI

International Classification:

G01T 1185
G01T 124

US Classification:

2503851

Abstract:

An ionization detector, an electrode configuration and a single polarity charge detection method each utilize a boundary electrode which symmetrically surrounds first and second central interlaced and symmetrical electrodes. All of the electrodes are held at a voltage potential of a first polarity type. The first central electrode is held at a higher potential than the second central or boundary electrodes. By forming the first and second central electrodes in a substantially interlaced and symmetrical pattern and forming the boundary electrode symmetrically about the first and second central electrodes, signals generated by charge carriers are substantially of equal strength with respect to both of the central electrodes. The only significant difference in measured signal strength occurs when the charge carriers move to within close proximity of the first central electrode and are received at the first central electrode. The measured signals are then subtracted and compared to quantitatively measure the magnitude of the charge.