Yevgeny P Kaplun

US Patent:

8481963, Jul 9, 2013

Filed:

Feb 27, 2012

Appl. No.:

13/406157

Inventors:

James L. Bertsch - Palo Alto CA, US
Michael Ugarov - San Jose CA, US
William E. Barry - Sunnyvale CA, US
Yevgeny Kaplun - Mountain View CA, US

Assignee:

Agilent Technologies, Inc. - Santa Clara CA

International Classification:

H01J 37/147
H01J 37/04
G21K 1/04
H01J 49/06

US Classification:

250397, 250305, 250287, 250398, 25049221

Abstract:

Described herein is an ion slicer that: a) accelerates an ion beam towards a first electrode comprising an ion entrance slit, where the first electrode blocks a portion of ions with high displacement from the axis of the ion beam, thereby slicing the ion beam; and then b) decelerates the ion beam after it is sliced.

US Patent:

20120217388, Aug 30, 2012

Filed:

Feb 27, 2012

Appl. No.:

13/406182

Inventors:

James L. Bertsch - Palo Alto CA, US
Michael Ugarov - San Jose CA, US
William E. Barry - Sunnyvale CA, US
Yevgeny Kaplun - Mountain View CA, US

International Classification:

H01J 49/40
H01J 3/14

US Classification:

250287, 250396 R

Abstract:

Provided herein is a bladed ion slicer for blocking ions in an ion beam that have significant distance from the beam axis. In certain embodiments, the bladed ion slicer comprises a body; a first elongated blade; and a second elongated blade; wherein the ion slicer comprises a slit that extends through the body through which ions pass and wherein the edges of the first and second elongated blades define the entrance of the slit and are pointing towards the ion beam. A mass spectrometer system and method for removing unwanted ions are also provided.

US Patent:

57773254, Jul 7, 1998

Filed:

May 6, 1996

Appl. No.:

8/643708

Inventors:

Scot R. Weinberger - Montara CA
Edward P. Donlon - San Jose CA
Yevgeny Kaplun - Mountain View CA
Tor C. Anderson - Palo Alto CA
Liang Li - Edmonton, CA
Larry Russon - Edmonton, CA
Randy Whittal - Edmonton, CA

Assignee:

Hewlett-Packard Company - Palo Alto CA

International Classification:

H01J 4940

US Classification:

250287

Abstract:

A laser desorption ionization instrument for and method of measuring the molecular weight of large organic molecules includes a time of flight mass spectrometer (TOF MS). The TOF MS instrument provides optimized optic design for both DC and TLF modes. The invention further provides dynamic resolution enhancement for a given ejection pulse, along with optimized ion ejection pulses relative to the ion optic elements. The invention also provides means for compensating for difference in total kinetic energy among ions of different mass; high resolution detection means for improved sensitivity for large molecular weight species. The invention further provides x-y-z stage for sample presentation of both standard MALDI and gel or membrane based samples.