Virginia H. Brecher - West Cornwall CT Paul B.-L Chou - Montvale NJ Robert W. Hall - Jericho VT Debra M. Parisi - Carmel NY Ravishankar Rao - White Plains NY Stuart L. Riley - Colchester VT Martin C. Sturzenbecker - Carmel NY
Assignee:
International Business Machines Corporation - Armonk NY
International Classification:
G06K 900 G06K 962 G06G 700
US Classification:
382149
Abstract:
An integrated visual defect detection and classification system. The invention includes adaptive defect detection and image labeling, defect feature measures, and a knowledge based inference shell/engine for classification based on fuzzy logic. The combination of these elements comprises a method and system for providing detection and analysis of product defects in many application domains, such as semiconductor and electronic packaging manufacturing.