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Varsha C Hedau

age ~41

from Sunnyvale, CA

Also known as:
  • Varsha Heada
  • Hedau Varsha
  • Varsha U
Phone and address:
787 Holbrook Pl, Sunnyvale, CA 94087

Varsha Hedau Phones & Addresses

  • 787 Holbrook Pl, Sunnyvale, CA 94087
  • San Jose, CA
  • Schaumburg, IL
  • Champaign, IL
  • Reston, VA

Work

  • Company:
    Apple
    Jul 2015 to Oct 2017
  • Position:
    R and d

Education

  • Degree:
    Doctorates, Doctor of Philosophy
  • School / High School:
    University of Illinois at Urbana - Champaign
    2006 to 2011
  • Specialities:
    Computer Engineering, Philosophy

Skills

Computer Vision • Pattern Recognition • Matlab • Machine Learning • Image Processing • Algorithms • Computer Science • Artificial Intelligence • Opencv • Data Mining • Signal Processing • Python • C++ • C • Latex • C/C++ Stl • C# • Deep Learning • Tensorflow • Caffe

Industries

Consumer Electronics

Us Patents

  • Inserting Objects Into Content

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  • US Patent:
    20130147798, Jun 13, 2013
  • Filed:
    Dec 8, 2011
  • Appl. No.:
    13/314723
  • Inventors:
    Kevin Karsch - Urbana IL, US
    Varsha Chandrashekhar Hedau - Sunnyvale CA, US
    David A. Forsyth - Urbana IL, US
    Derek Hoiem - Champaign IL, US
  • Assignee:
    The Board of Trustees of the University of Illinois - Urbana IL
  • International Classification:
    G06T 17/00
  • US Classification:
    345420
  • Abstract:
    An image into which one or more objects are to be inserted is obtained. Based on the image, both a 3-dimensional (3D) representation and a light model of the scene in the image are generated. One or more objects are added to the 3D representation of the scene. The 3D representation of the scene is rendered, based on the light model, to generate a modified image that is the obtained image modified to include the one or more objects.
  • Location-Aided Recognition

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  • US Patent:
    20120321175, Dec 20, 2012
  • Filed:
    Jun 17, 2011
  • Appl. No.:
    13/162591
  • Inventors:
    Varsha Hedau - Schaumburg IL, US
    Sudipta Sinha - Redmond WA, US
    Charles Lawrence Zitnick - Seattle WA, US
    Richard Szeliski - Bellevue WA, US
  • Assignee:
    Microsoft Corporation - Redmond WA
  • International Classification:
    G06K 9/62
  • US Classification:
    382159, 382224
  • Abstract:
    A mobile device having the capability of performing real-time location recognition with assistance from a server is provided. The approximate geophysical location of the mobile device is uploaded to the server. Based on the mobile device's approximate geophysical location, the server responds by sending the mobile device a message comprising a classifier and a set of feature descriptors. This can occur before an image is captured for visual querying. The classifier and feature descriptors are computed during an offline training stage using techniques to minimize computation at query time. The classifier and feature descriptors are used to perform visual recognition in real-time by performing the classification on the mobile device itself.
  • Entrance Detection From Street-Level Imagery

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  • US Patent:
    20190258861, Aug 22, 2019
  • Filed:
    Apr 30, 2019
  • Appl. No.:
    16/399507
  • Inventors:
    - San Francisco CA, US
    Vasudev Parameswaran - Fremont CA, US
    Thommen Korah - San Ramon CA, US
    Varsha Hedau - San Jose CA, US
    Radek Grzeszczuk - Menlo Park CA, US
    Yanxi Liu - Mountain View CA, US
  • International Classification:
    G06K 9/00
    G06K 9/46
    G06T 7/90
    G06K 9/62
  • Abstract:
    Architecture that detects entrances on building facades. In a first stage, scene geometry is exploited and the multi-dimensional problem is reduced down to a one-dimensional (1D) problem. Entrance hypotheses are generated by considering pairs of locations along lines exhibiting strong gradients in the transverse direction. In a second stage, a rich set of discriminative image features for entrances is explored according to constructed designs, specifically focusing on properties such as symmetry and color consistency, for example. Classifiers (e.g., random forest) are utilized to perform automatic feature selection and entrance classification. In another stage, a joint model is formulated in three dimensions (3D) for entrances on a given facade, which enables the exploitation of physical constraints between different entrances on the same facade in a systematic manner to prune false positives, and thereby select an optimum set of entrances on a given facade.
  • Entrance Detection From Street-Level Imagery

    view source
  • US Patent:
    20180060664, Mar 1, 2018
  • Filed:
    Oct 23, 2017
  • Appl. No.:
    15/790571
  • Inventors:
    - San Francisco CA, US
    Vasudev Parameswaran - Fremont CA, US
    Thommen Korah - San Ramon CA, US
    Varsha Hedau - San Jose CA, US
    Radek Grzeszczuk - Menlo Park CA, US
    Yanxi Liu - Mountain View CA, US
  • International Classification:
    G06K 9/00
    G06K 9/46
    G06K 9/62
  • Abstract:
    Architecture that detects entrances on building facades. In a first stage, scene geometry is exploited and the multi-dimensional problem is reduced down to a one-dimensional (D) problem. Entrance hypotheses are generated by considering pairs of locations along lines exhibiting strong gradients in the transverse direction. In a second stage, a rich set of discriminative image features for entrances is explored according to constructed designs, specifically focusing on properties such as symmetry and color consistency, for example. Classifiers (e.g., random forest) are utilized to perform automatic feature selection and entrance classification. In another stage, a joint model is formulated in three dimensions (D) for entrances on a given facade, which enables the exploitation of physical constraints between different entrances on the same facade in a systematic manner to prune false positives, and thereby select an optimum set of entrances on a given facade.
  • Entrance Detection From Street-Level Imagery

    view source
  • US Patent:
    20170091553, Mar 30, 2017
  • Filed:
    Dec 8, 2016
  • Appl. No.:
    15/373354
  • Inventors:
    - San Francisco CA, US
    Vasudev Parameswaran - Fremont CA, US
    Thommen Korah - San Ramon CA, US
    Varsha Hedau - San Jose CA, US
    Radek Grzeszczuk - Menlo Park CA, US
    Yanxi Liu - Mountain View CA, US
  • International Classification:
    G06K 9/00
    G06K 9/46
    G06K 9/62
  • Abstract:
    Architecture that detects entrances on building facades. In a first stage, scene geometry is exploited and the multi-dimensional problem is reduced down to a one-dimensional (1D) problem. Entrance hypotheses are generated by considering pairs of locations along lines exhibiting strong gradients in the transverse direction. In a second stage, a rich set of discriminative image features for entrances is explored according to constructed designs, specifically focusing on properties such as symmetry and color consistency, for example. Classifiers (e.g., random forest) are utilized to perform automatic feature selection and entrance classification. In another stage, a joint model is formulated in three dimensions (3D) for entrances on a given facade, which enables the exploitation of physical constraints between different entrances on the same facade in a systematic manner to prune false positives, and thereby select an optimum set of entrances on a given facade.
  • Entrance Detection From Street-Level Imagery

    view source
  • US Patent:
    20150356368, Dec 10, 2015
  • Filed:
    Jun 8, 2014
  • Appl. No.:
    14/298932
  • Inventors:
    - Redmond WA, US
    Vasudev Parameswaran - Fremont CA, US
    Thommen Korah - San Ramon CA, US
    Varsha Hedau - San Jose CA, US
    Radek Grzeszczuk - Menlo Park CA, US
    Yanxi Liu - Mountain View CA, US
  • Assignee:
    MICROSOFT CORPORATION - Redmond WA
  • International Classification:
    G06K 9/46
    G06T 7/40
    G06K 9/62
  • Abstract:
    Architecture that detects entrances on building facades. In a first stage, scene geometry is exploited and the multi-dimensional problem is reduced down to a one-dimensional (1D) problem. Entrance hypotheses are generated by considering pairs of locations along lines exhibiting strong gradients in the transverse direction. In a second stage, a rich set of discriminative image features for entrances is explored according to constructed designs, specifically focusing on properties such as symmetry and color consistency, for example. Classifiers (e.g., random forest) are utilized to perform automatic feature selection and entrance classification. In another stage, a joint model is formulated in three dimensions (3D) for entrances on a given facade, which enables the exploitation of physical constraints between different entrances on the same facade in a systematic manner to prune false positives, and thereby select an optimum set of entrances on a given facade.

Resumes

Varsha Hedau Photo 1

Technician Lead, Manager Senior .Applied Scientist

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Location:
Sunnyvale, CA
Industry:
Consumer Electronics
Work:
Apple Jul 2015 - Oct 2017
R and D

Amazon Lab126 Jul 2015 - Oct 2017
Technician Lead, Manager Senior .Applied Scientist

Microsoft Oct 2012 - Oct 2014
Scientist

Nokia Aug 2011 - Sep 2012
Senior Researcher

University of Illinois at Urbana-Champaign Aug 2006 - Aug 2011
Research Assistant
Education:
University of Illinois at Urbana - Champaign 2006 - 2011
Doctorates, Doctor of Philosophy, Computer Engineering, Philosophy
Indian Institute of Technology, Kanpur 2004 - 2006
Masters, Master of Technology, Electrical Engineering
College of Engineering Pune 2000 - 2004
Bachelor of Engineering, Bachelors, Telecommunications, Electronics
Skills:
Computer Vision
Pattern Recognition
Matlab
Machine Learning
Image Processing
Algorithms
Computer Science
Artificial Intelligence
Opencv
Data Mining
Signal Processing
Python
C++
C
Latex
C/C++ Stl
C#
Deep Learning
Tensorflow
Caffe

Googleplus

Varsha Hedau Photo 2

Varsha Hedau


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