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Suckheui Chung

age ~54

from Charlestown, MA

Also known as:
  • Suck Chung

Suckheui Chung Phones & Addresses

  • Charlestown, MA
  • 2 Museum Sq, Lawrence, MA 01840 • 9786852248
  • Nashua, NH
  • Woburn, MA

Work

  • Company:
    Amd
    Apr 2013
  • Address:
    Greater Boston Area
  • Position:
    Mts

Education

  • Degree:
    MBA
  • School / High School:
    Northeastern University - Graduate School of Business Administration
    2002 to 2004
  • Specialities:
    MBA

Languages

English • Korean • Chinese • Japanese

Industries

Semiconductors
Name / Title
Company / Classification
Phones & Addresses
Suckheui Chung
Manager
EM ROBOTICS LLC
4 Euston St UNIT 1, Brookline, MA 02446
22 Albion St UNIT 2, Charlestown, MA 02129

Resumes

Suckheui Chung Photo 1

Mts At Amd

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Position:
MTS at AMD, Partner at HQT Consulting
Location:
Greater Boston Area
Industry:
Semiconductors
Work:
AMD - Greater Boston Area since Apr 2013
MTS

HQT Consulting - Greater Boston Area since Feb 2000
Partner

STMicroelectronics - Phoenix, Arizona Area Jun 2012 - Mar 2013
Sr. Principal Consultant

Applied Micro Circuits Jan 2011 - Feb 2012
Sr. Product Marketing Manager

Applied Micro Circuits Jun 2006 - Jan 2011
Principal Design Engineer
Education:
Northeastern University - Graduate School of Business Administration 2002 - 2004
MBA, MBA
The University of Manchester, UK 1997 - 1999
MSc, Computer Science
Yonsei University 1986 - 1990
BSc, Electronics
Languages:
English
Korean
Chinese
Japanese

Us Patents

  • System And Method For Utilizing An Automatic Circuit Tester System Having Multiple Automatic Circuit Tester Platforms

    view source
  • US Patent:
    20080030203, Feb 7, 2008
  • Filed:
    Nov 17, 2006
  • Appl. No.:
    11/561000
  • Inventors:
    Suckheui Chung - Charlestown MA,
    Byeongseo Yook - Brookline MA,
  • Assignee:
    Infinitest LLC - Charlestown MA
  • International Classification:
    G01R 31/00
  • US Classification:
    324537
  • Abstract:
    The ATE system includes a system computer. A plurality of platform computers is in communication with the system computer. A plurality of test instrument boards is provided. Each of the platform computers is in communication with at least one of the test instrument boards. At least one device interface board is provided. Each of the plurality of test instrument boards is in communication with at least one of the device interface boards. At least one device mover is proximate to at least one of the device interface boards for moving devices under testing to at least one of the device interface boards.

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