STMicroelectronics - Phoenix, Arizona Area since Jun 2012
Sr. Principal Consultant
HQT Consulting - Greater Boston Area since Feb 2000
Partner
Applied Micro Circuits Jan 2011 - Feb 2012
Sr. Product Marketing Manager
Applied Micro Circuits Jun 2006 - Jan 2011
Principal Design Engineer
Infinitest - Greater Boston Area Nov 2005 - Jun 2006
Founder
Education:
Northeastern University - Graduate School of Business Administration 2002 - 2004
MBA, MBA
The University of Manchester, UK 1997 - 1999
MSc, Computer Science
Yonsei University 1986 - 1990
BSc, Electronics
Skills:
Asic Soc Fpga Arm Digital Signal Processors Static Timing Analysis Ate Semiconductors Product Development Systemverilog Verilog Product Marketing New Business Development Marketing Strategy Competitive Analysis Product Management Ic Dft Analog Embedded Software Functional Verification Microprocessors Powerpc Arm 64Bit Dsp Global Business Development China Business Development Cloud Computing Mobile Technology Uvm Ovm Verification Formal Verification Cdc Rtl C++ Vlsi Embedded Systems Eda Software Engineering Testing Tcl Timing Closure Perl Debugging Processors
Languages:
English Korean Mandarin Japanese
Certifications:
License Ky4Ce4Uanq R Programming Coursera Verified Certificates, License Ky4Ce4Uanq
Us Patents
System And Method For Utilizing An Automatic Circuit Tester System Having Multiple Automatic Circuit Tester Platforms
Suckheui Chung - Charlestown MA, US Byeongseo Yook - Brookline MA, US
Assignee:
Infinitest LLC - Charlestown MA
International Classification:
G01R 31/00
US Classification:
324537
Abstract:
The ATE system includes a system computer. A plurality of platform computers is in communication with the system computer. A plurality of test instrument boards is provided. Each of the platform computers is in communication with at least one of the test instrument boards. At least one device interface board is provided. Each of the plurality of test instrument boards is in communication with at least one of the device interface boards. At least one device mover is proximate to at least one of the device interface boards for moving devices under testing to at least one of the device interface boards.