Sheryl A Ihde

US Patent:

7035877, Apr 25, 2006

Filed:

Nov 27, 2002

Appl. No.:

10/306868

Inventors:

Charles Earl Markham - Appleton WI, US
Douglas Gordon Barron Barber - Appleton WI, US
John Harland Hise - Neenah WI, US
Sheryl Annette Ihde - Greenville WI, US
Jeffrey Dean Lindsay - Appleton WI, US
Kurt Sigurd Nygaard - Appleton WI, US
Michael Roy Pokorny - Neenah WI, US
Michael T. Price - Oshkosh WI, US
Walter Caswell Reade - Appleton WI, US
Gregory Duncan Shaffer - Neenah WI, US
Roger Dale Yosten - Sumner TX, US

Assignee:

Kimberly-Clark Worldwide, Inc. - Neenah WI

International Classification:

G06F 17/18

US Classification:

707200, 707202

Abstract:

Providing quality management and intelligent manufacturing with labels and smart tags in event-based product manufacturing. Some of the disclosed embodiments include a system, method, and computer-readable media for storing, during a process, data associated with a material. Also disclosed are a method of collecting, storing, and reporting machine productivity, waste, and delay information on an event basis in a manufacturing system, a method of capturing and storing material history, a method of automating tracking of positions of components used in a process and correlating portions of a component with production problems, an improved inventory management system, and a method of tracking and recording actions of specific operators of a process performed by a machine. The embodiments are operable in an intelligent manufacturing system including a process for converting raw materials to a product, a process control system including one or more sensors capable of generating an alarm in response to an event that results in one of waste, machine delay, or decrease product quality, a data logger associated with the process control system for obtaining event parameters associated with the event, a database on a server for recording event parameters obtained by the data logger, and a reporting system cooperatively associated with the database for reporting productivity parameters regarding the process derived at least in part from the event parameters.

US Patent:

7401728, Jul 22, 2008

Filed:

Apr 24, 2006

Appl. No.:

11/410268

Inventors:

Charles Earl Markham - Appleton WI, US
Douglas Gordon Barron Barber - Appleton WI, US
Paul D. Fuller - Menasha WI, US
John Harland Hise - Neenah WI, US
Sheryl Annette Ihde - Greenville WI, US
Jeffrey Dean Lindsay - Appleton WI, US
Jon Ray Matheus - Appleton WI, US
Kurt Sigurd Nygaard - Appleton WI, US
Michael Roy Pokorny - Neenah WI, US
Walter Caswell Reade - Appleton WI, US
Gregory Duncan Shaffer - Neenah WI, US
Flynn Matthew Tiffany - Layton UT, US
Roger Dale Yosten - Sumner TX, US

Assignee:

Kimberly-Clark Worldwide, Inc. - Neenah WI

International Classification:

G06F 7/00

US Classification:

235376, 235375, 235380

Abstract:

Communication between machines in an event-based manufacturing system. In an event-based manufacturing system, material-specific data obtained for a material produced during a first manufacturing operation is used to govern a second manufacturing operation to decrease the likelihood of at least a delay event, a waste event, or poor quality of the product.

US Patent:

7882438, Feb 1, 2011

Filed:

Feb 27, 2006

Appl. No.:

11/363476

Inventors:

Charles Earl Markham - Appleton WI, US
Douglas Gordon Barron Barber - Appleton WI, US
John Harland Hise - Neenah WI, US
Sheryl Annette Ihde - Greenville WI, US
Jeffrey Dean Lindsay - Appleton WI, US
Kurt Sigurd Nygaard - Appleton WI, US
Michael Roy Pokorny - Neenah WI, US
Michael T. Price - Oshkosh WI, US
Walter Caswell Reade - Appleton WI, US
Gregory Duncan Shaffer - Neenah WI, US
Roger Dale Yosten - Sumner TX, US

International Classification:

G06F 19/00

US Classification:

715736, 700106, 700109, 700 13, 700 19

Abstract:

Providing quality management and intelligent manufacturing with labels and smart tags in event-based product manufacturing. Some of the disclosed embodiments include a system, method, and computer-readable media for storing, during a process, data associated with a material. Also disclosed are a method of collecting, storing, and reporting machine productivity, waste, and delay information on an event basis in a manufacturing system, a method of capturing and storing material history, a method of automating tracking of positions of components used in a process and correlating portions of a component with production problems, an improved inventory management system, and a method of tracking and recording actions of specific operators of a process performed by a machine. The embodiments are operable in an intelligent manufacturing system including a process for converting raw materials to a product, a process control system including one or more sensors capable of generating an alarm in response to an event that results in one of waste, machine delay, or decrease product quality, a data logger associated with the process control system for obtaining event parameters associated with the event, a database on a server for recording event parameters obtained by the data logger, and a reporting system cooperatively associated with the database for reporting productivity parameters regarding the process derived at least in part from the event parameters.

US Patent:

20030150909, Aug 14, 2003

Filed:

Nov 27, 2002

Appl. No.:

10/306883

Inventors:

Charles Markham - Appleton WI, US
Douglas Barber - Appleton WI, US
Amy Boyd - Neenah WI, US
Gary Goggans - Appleton WI, US
John Hise - Neenah WI, US
Sheryl Ihde - Greenville WI, US
Jeffrey Lindsay - Appleton WI, US
Jolene Meissner - DePere WI, US
Jamie Mork - Greenville WI, US
Kurt Nygaard - Appleton WI, US
Scott Park - Menasha WI, US
Michael Pokorny - Neenah WI, US
Walter Reade - Appleton WI, US
John Reynders - Appleton WI, US
Gregory Shaffer - Neenah WI, US
Roger Yosten - Sumner TX, US

Assignee:

Kimberly-Clark Worldwide, Inc.

International Classification:

G06F007/00

US Classification:

235/376000

Abstract:

Providing quality management by validating a bill of materials in event-based product manufacturing. Some of the disclosed embodiments include a system and method for validating materials during manufacture of a product. Also disclosed are a method of validating that acceptable materials are being used on a machine during manufacture of a product, and one or more computer-readable media for storing a data structure representing a product specification in an event-based manufacturing system. The embodiments are operable in an intelligent manufacturing system including a process for converting raw materials to a product, a process control system including one or more sensors capable of generating an alarm in response to an event that results in one of waste, machine delay, or decrease product quality, a data logger associated with the process control system for obtaining event parameters associated with the event, a database on a server for recording event parameters obtained by the data logger, and a reporting system cooperatively associated with the database for reporting productivity parameters regarding the process derived at least in part from the event parameters.

US Patent:

20030155415, Aug 21, 2003

Filed:

Nov 27, 2002

Appl. No.:

10/306794

Inventors:

Charles Markham - Appleton WI, US
Douglas Barber - Appleton WI, US
Paul Fuller - Menasha WI, US
John Hise - Neenah WI, US
Sheryl Ihde - Greenville WI, US
Jeffrey Lindsay - Appleton WI, US
Jon Matheus - Appleton WI, US
Kurt Nygaard - Appleton WI, US
Michael Pokorny - Neenah WI, US
Walter Reads - Appleton WI, US
Gregory Shaffer - Neenah WI, US
Flynn Tiffany - Layton UT, US
Roger Yosten - Sumner TX, US

Assignee:

Kimberly-Clark Worldwide, Inc.

International Classification:

G06F007/00

US Classification:

235/376000

Abstract:

Providing communication between machines and feed-forward control in event-based product manufacturing. Some of the disclosed embodiments include a system, method, and computer-readable media for communicating data relating to a material between machines during a process for feed-forward control. Also disclosed are an intelligent event-based manufacturing system including a process for converting a raw material to a product and a method of reducing the probability of waste, delay, or a quality defect in a process having process conditions for the manufacture of a product from a sequentially trackable raw material. The embodiments are operable in an intelligent manufacturing system including a process for converting raw materials to a product, a process control system including one or more sensors capable of generating an alarm in response to an event that results in one of waste, machine delay, or decrease product quality, a data logger associated with the process control system for obtaining event parameters associated with the event, a database on a server for recording event parameters obtained by the data logger, and a reporting system cooperatively associated with the database for reporting productivity parameters regarding the process derived at least in part from the event parameters.