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Paul Allen Getchel

age ~65

from Fallon, NV

Also known as:
  • Paul A Getchel
  • Paula Getchel
  • Paul A Lattin
  • Paul A Getchell
  • Paul Gotchel

Paul Getchel Phones & Addresses

  • Fallon, NV
  • El Dorado Hills, CA
  • Shingle Springs, CA
  • Honolulu, HI
  • Placerville, CA
  • East Taunton, MA
  • El Dorado, CA
  • San Jose, CA
Name / Title
Company / Classification
Phones & Addresses
Paul A. Getchel
Owner
Ideasolutions Design
Engineering Services · Engineers-Consulting
685 Placerville Dr, Swansboro Country, CA 95667
5306221572, 5306221623
Paul A. Getchel
Managing
Gmp Centers, Limited Liability Company
Preschool
685 Placerville Dr, Swansboro Country, CA 95667
3841 Ponderosa Rd, Shingle Springs, CA 95682

Resumes

Paul Getchel Photo 1

Paul Getchel

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Us Patents

  • Workpiece Chuck With Guard Layer Having Vacuum Distribution Pattern

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  • US Patent:
    6375176, Apr 23, 2002
  • Filed:
    Dec 16, 1999
  • Appl. No.:
    09/464998
  • Inventors:
    Paul A. Getchel - Placerville CA
    Henry A. Lyden - Wellesley MA
    William M. Stone - Lenox MA
    Robert Lopez - Boxford MA
    Thomas Schey - Woonsocket RI
    Dana G. Butcher - Somerville MA
  • Assignee:
    Temptronic Corporation - Sharon MA
  • International Classification:
    B25B 1100
  • US Classification:
    269 21, 118728, 165 801, 279 3, 269903
  • Abstract:
    A workpiece chuck includes an upper assembly on which can be mounted a flat workpiece such as a semiconductor wafer. A lower assembly is mountable to a base that supports the chuck. A non-constraining attachment means such as vacuum, springs or resilient washers applied to the chuck holds the upper assembly to the lower assembly, the lower assembly to the base and can hold the wafer to the top surface of the upper assembly. By holding the chuck together by non-constraining means, the chuck layers can move continuously relative to each other under expansion forces caused by temperature effects, such that mechanical stresses on the chuck and resulting deformation of the chuck and workpiece over temperature are substantially eliminated. A plurality of support members including inclined surfaces provided between an upper and lower portion of the chuck maintain the top surface of the chuck and any workpiece mounted thereon at a constant height over temperature.
  • Snap Hook Applicator Device

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  • US Patent:
    6412432, Jul 2, 2002
  • Filed:
    Feb 2, 2001
  • Appl. No.:
    09/776790
  • Inventors:
    Del White - Carson City NV 89706-0482
    Paul A. Getchel - Placerville CA 95667-4231
  • International Classification:
    B63B 900
  • US Classification:
    114221R, 294 191
  • Abstract:
    An applicator device ( ) for coupling a snap hook ( ) to a hook connector ( ). The applicator device includes an applicator head and a receptacle ( ). The applicator head defines a snap hook receiving receptacle ( ) which is formed to position the snap hook ( ) for, and to support the snap hook ( ) during, coupling of the snap hook ( ) to the hook connector ( ) while the snap hook is engaged in the receptacle ( ). The receptacle ( ) is further formed for disengagement of the applicator head ( ) from the snap hook while the snap hook is coupled to the hook connector upon displacement of the applicator head in a direction lateral to the snap hook. A method of using the applicator device is also disclosed.
  • Temperature Control System For A Workpiece Chuck

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  • US Patent:
    6415858, Jul 9, 2002
  • Filed:
    Dec 31, 1997
  • Appl. No.:
    09/001887
  • Inventors:
    Paul A. Getchel - Placerville CA
    Henry A. Lyden - Wellesley MA
  • Assignee:
    Temptronic Corporation - Sharon MA
  • International Classification:
    F25B 2900
  • US Classification:
    165206, 165263, 165 481, 165 804, 165 63, 165 64, 165296, 165101, 165 801, 324760, 359395
  • Abstract:
    A system for and method of controlling the temperature of a flat workpiece such as a semiconductor wafer are disclosed. The workpiece is mounted on a workpiece chuck which is mounted over a base between the chuck and a host machine such as a wafer prober used to test integrated circuits on a wafer. The chuck includes an upper portion on which the workpiece is mounted. The temperature of the upper portion of the chuck is controlled to control the temperature of the workpiece. The temperature of the base is controlled to reduce the amount of heat flow between the chuck and the host machine. A power and control system includes a switching power supply which provides power to system components including heaters in the chuck used to heat the workpiece. A series of filters removes electrical noise generated by the switching power supply such that low-noise operation is realized.
  • Workpiece Chuck

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  • US Patent:
    6540014, Apr 1, 2003
  • Filed:
    Feb 29, 2000
  • Appl. No.:
    09/516000
  • Inventors:
    Paul A. Getchel - Placerville CA
    Henry A. Lyden - Wellesley MA
  • Assignee:
    Temptronic Corporation - Sharon MA
  • International Classification:
    F28F 700
  • US Classification:
    165 801, 165 802, 165 82, 165185, 118728, 269 21, 269903, 279 3
  • Abstract:
    A workpiece chuck includes an upper assembly on which can be mounted a flat workpiece such as a semiconductor wafer. A lower assembly is mountable to a base that supports the chuck. A non-constraining attachment means such as vacuum, springs or resilient washers applied to the chuck holds the upper assembly to the lower assembly, the lower assembly to the base and can hold the wafer to the top surface of the upper assembly. A heater and a heat sink can be included in the bottom assembly to allow for temperature cycle testing of the wafer. By holding the chuck together by non-constraining means, the chuck layers can move continuously relative to each other under expansion forces caused by temperature effects. Mechanical stresses on the chuck and resulting deformation of the chuck and workpiece over temperature are substantially eliminated.
  • Temperature Control System For A Workpiece Chuck

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  • US Patent:
    6802368, Oct 12, 2004
  • Filed:
    Jan 16, 2002
  • Appl. No.:
    10/052861
  • Inventors:
    Paul A. Getchel - Placerville CA
    Henry A. Lyden - Wellesley MA
  • Assignee:
    Temptronic Corporation - Sharon MA
  • International Classification:
    F25B 2900
  • US Classification:
    165206, 165263, 165 481, 165 804, 165 63, 165 64, 165296, 165101, 165 801, 324760, 359395
  • Abstract:
    A system for and method of controlling the temperature of a flat workpiece such as a semiconductor wafer are disclosed. The workpiece is mounted on a workpiece chuck which is mounted over a base between the chuck and a host machine such as a wafer prober used to test integrated circuits on a wafer. The chuck includes an upper portion on which the workpiece is mounted. The temperature of the upper portion of the chuck is controlled to control the temperature of the workpiece. The temperature of the base is controlled to reduce the amount of heat flow between the chuck and the host machine. A power and control system includes a switching power supply which provides power to system components including heaters in the chuck used to heat the workpiece. A series of filters removes electrical noise generated by the switching power supply such that low-noise operation is realized.
  • Fuel Cell Power And Management System, And Technique For Controlling And/Or Operating Same

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  • US Patent:
    7271567, Sep 18, 2007
  • Filed:
    Aug 11, 2005
  • Appl. No.:
    11/201472
  • Inventors:
    Glenn M. Dunn - Fair Oaks CA, US
    Paul Getchel - Placerville CA, US
    Duncan D. MacGregor - Shingle Springs CA, US
    Sinclair D. MacGregor - Shingle Springs CA, US
    Kenneth E. Pearson - Shingle Springs CA, US
  • Assignee:
    Jadoo Power Systems, Inc. - Folsom CA
  • International Classification:
    H01M 10/46
  • US Classification:
    320101
  • Abstract:
    There are many inventions described and illustrated herein. In one aspect, the present invention is directed to a portable fuel cell power and management system (for example, hydrogen and/or methanol based systems), components and/or elements thereof, as well as techniques for controlling and/or operating such systems. The fuel cell power management system (and method of controlling and/or operating same) actively monitors, manages and/or controls one or more operating parameter(s) of the fuel cell system. For example, the system monitors, manages and/or controls the consumption and/or the rate of consumption of fuel by the system, and in response thereto, may provide and/or alert the user to amount of fuel remaining, consumed, the rate of consumption and/or the time (or estimation thereof) remaining until all of the fuel is spent. In this way, the user may schedule or plan accordingly.
  • Power Unit For A Fuel Cell Power And Management System

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  • US Patent:
    7888906, Feb 15, 2011
  • Filed:
    Sep 13, 2006
  • Appl. No.:
    11/520352
  • Inventors:
    Glenn M. Dunn - Fair Oaks CA, US
    Paul Getchel - Placerville CA, US
    Duncan D. MacGregor - Shingle Springs CA, US
    Sinclair D. MacGregor - Shingle Springs CA, US
    Kenneth E. Pearson - Shingle Springs CA, US
  • Assignee:
    Jadoo Power Systems, Inc. - Folsom CA
  • International Classification:
    H02J 7/00
    H01M 10/44
    H01M 10/46
  • US Classification:
    320101, 320134
  • Abstract:
    There are many inventions described and illustrated herein. In one aspect, the present invention is directed to a portable fuel cell power and management system (for example, hydrogen and/or methanol based systems), components and/or elements thereof, as well as techniques for controlling and/or operating such systems. The fuel cell power management system (and method of controlling and/or operating same) actively monitors, manages and/or controls one or more operating parameter(s) of the fuel cell system. For example, the system monitors, manages and/or controls the consumption and/or the rate of consumption of fuel by the system, and in response thereto, may provide and/or alert the user to amount of fuel remaining, consumed, the rate of consumption and/or the time (or estimation thereof) remaining until all of the fuel is spent. In this way, the user may schedule or plan accordingly.
  • System For A Fuel Cell Power And Management System

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  • US Patent:
    7893651, Feb 22, 2011
  • Filed:
    Sep 13, 2006
  • Appl. No.:
    11/520392
  • Inventors:
    Glenn M. Dunn - Fair Oaks CA, US
    Paul Getchel - Placerville CA, US
    Duncan D. MacGregor - Shingle Springs CA, US
    Sinclair D. MacGregor - Shingle Springs CA, US
    Kenneth E. Pearson - Shingle Springs CA, US
  • Assignee:
    Jadoo Power Systems, Inc. - Folsom CA
  • International Classification:
    H02J 7/00
    H01M 10/44
    H01M 10/46
  • US Classification:
    320101, 320134, 320150, 320155, 429 12, 429 13, 429 25
  • Abstract:
    There are many inventions described and illustrated herein. In one aspect, the present invention is directed to a portable fuel cell power and management system (for example, hydrogen and/or methanol based systems), components and/or elements thereof, as well as techniques for controlling and/or operating such systems. The fuel cell power management system (and method of controlling and/or operating same) actively monitors, manages and/or controls one or more operating parameter(s) of the fuel cell system. For example, the system monitors, manages and/or controls the consumption and/or the rate of consumption of fuel by the system, and in response thereto, may provide and/or alert the user to amount of fuel remaining, consumed, the rate of consumption and/or the time (or estimation thereof) remaining until all of the fuel is spent. In this way, the user may schedule or plan accordingly.

Youtube

Town of Black Wolf WI Real Estate for Sale 3 ...

More info: www.fwgmedia.com or www.fwgmedia.com Property Type: Single ...

  • Category:
    Travel & Events
  • Uploaded:
    10 Feb, 2010
  • Duration:
    33s

Paul's 4th

My brother's whole family visits their new place in rural Nevada to ce...

  • Duration:
    2m 11s

City of Oshkosh WI Real Estate for Sale 3 Bed...

... 2.50 bathrooms 2165 PARKSIDE DR, City of Oshkosh, WI 54901 MLS#: 3...

  • Duration:
    33s

City of Oshkosh WI Real Estate for Sale

... bathrooms 0 PARKWAY AVE, City of Oshkosh, WI 54901 MLS#: 30901466 ...

  • Duration:
    33s

GH010315

Skiing with Paul Getchel and Friends, Bretton Woods.

  • Duration:
    8m 56s

Funky Blues in G with the Les Paul.

Using the new Overload THU Slate Edition. Virtual Tips/Support: My M...

  • Duration:
    3m 31s

GH010310

Skiing with Paul Getchel and friends Date: ??

  • Duration:
    20s

GH010318

Skiing with Paul Getchel and friends.

  • Duration:
    1m 28s

Myspace

Paul Getchel Photo 2

Paul Getchel

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Locality:
Murrieta, California
Birthday:
1927

Classmates

Paul Getchel Photo 3

Paul Getchel

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Schools:
Lourdes Academy Oshkosh WI 1972-1976
Community:
Mary Pokrandt, Marita Makurat, Jim Morris

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