Lucas P Keranen

US Patent:

8631687, Jan 21, 2014

Filed:

Apr 19, 2011

Appl. No.:

13/090036

Inventors:

Justin D. Patten - Eden Prairie MN, US
Christopher David Young - Shorewood MN, US
Lucas Paul Keranen - Hutchinson MN, US

Assignee:

Hysitron, Inc. - Minneapolis MN

International Classification:

G01N 3/48

US Classification:

73 81

Abstract:

An indentation assembly for sub-micron testing includes an indentation tip and a tip holder coupled with the indentation tip. The tip holder includes a first thermal conductivity and a first coefficient of thermal expansion. A tip holder mount configured for coupling with a transducer and the tip holder, the tip holder mount having a second thermal conductivity greater than the first thermal conductivity, and the tip holder mount has a second coefficient of thermal expansion greater than the first coefficient of thermal expansion. The tip holder mount has a mount length, and the tip holder further has a tip holder length greater that the mount length. The tip holder remotely positions the tip holder mount relative to the indentation tip. The tip holder length, volume and the first thermal conductivity cooperate to throttle heat transfer through the tip holder prior to reaching the tip holder mount.

US Patent:

20130319071, Dec 5, 2013

Filed:

Aug 8, 2013

Appl. No.:

13/962849

Inventors:

Arpit Dwivedi - Chanhassen MN, US
Lucas Paul Keranen - Hutchinson MN, US
Michael David Okerlund - Minneapolis MN, US
Roger William Schmitz - Hutchinson MN, US
Oden Lee Warren - New Brighton MN, US
Christopher David Young - Excelsior MN, US

Assignee:

Hysitron, Inc. - Eden Prairie MN

International Classification:

G01P 21/00

US Classification:

73 108

Abstract:

An automated testing system includes systems and methods to facilitate inline production testing of samples at a micro (multiple microns) or less scale with a mechanical testing instrument. In an example, the system includes a probe changing assembly for coupling and decoupling a probe of the instrument. The probe changing assembly includes a probe change unit configured to grasp one of a plurality of probes in a probe magazine and couple one of the probes with an instrument probe receptacle. An actuator is coupled with the probe change unit, and the actuator is configured to move and align the probe change unit with the probe magazine and the instrument probe receptacle. In another example, the automated testing system includes a multiple degree of freedom stage for aligning a sample testing location with the instrument. The stage includes a sample stage and a stage actuator assembly including translational and rotational actuators.

US Patent:

20130319127, Dec 5, 2013

Filed:

Aug 8, 2013

Appl. No.:

13/962865

Inventors:

Arpit Dwivedi - Chanhassen MN, US
Lucas Paul Keranen - Hutchinson MN, US
Michael David Okerlund - Minneapolis MN, US
Roger William Schmitz - Hutchinson MN, US
Oden Lee Warren - New Brighton MN, US
Christopher David Young - Excelsior MN, US

Assignee:

Hysitron, Inc. - Eden Prairie MN

International Classification:

G01N 3/02

US Classification:

73788, 29428

Abstract:

An automated testing system includes systems and methods to facilitate inline production testing of samples at a micro (multiple microns) or less scale with a mechanical testing instrument. In an example, the system includes a probe changing assembly for coupling and decoupling a probe of the instrument. The probe changing assembly includes a probe change unit configured to grasp one of a plurality of probes in a probe magazine and couple one of the probes with an instrument probe receptacle. An actuator is coupled with the probe change unit, and the actuator is configured to move and align the probe change unit with the probe magazine and the instrument probe receptacle. In another example, the automated testing system includes a multiple degree of freedom stage for aligning a sample testing location with the instrument. The stage includes a sample stage and a stage actuator assembly including translational and rotational actuators.

US Patent:

20130332100, Dec 12, 2013

Filed:

Nov 23, 2011

Appl. No.:

13/989383

Inventors:

Christopher David Young - Excelsior, MN
Daniel Paul Carlson - Coon Rapids MN, US
Lucas Paul Keranen - Hutchinson MN, US
Jeffrey P. Schirer - Minnetonka MN, US

International Classification:

G01D 18/00

US Classification:

702105

Abstract:

A method of calibrating a mechanical instrument assembly includes reading a memory device coupled with a mechanical testing instrument, the mechanical testing instrument having one or more mechanical characteristics with values unique to the mechanical testing instrument, and reading includes reading of one or more calibration values based on the one or more mechanical characteristic values. The method further includes calibrating the mechanical instrument assembly according to the one or more calibration values. The mechanical testing instrument is coupled with the mechanical instrument assembly.

US Patent:

7549211, Jun 23, 2009

Filed:

Jun 30, 2006

Appl. No.:

11/427842

Inventors:

Lucas P. Keranen - Hutchinson MN, US
Hryhory T. Koba - Hutchinson MN, US
Raymond A. Loehlein - Minneapolis MN, US
Patrick E. Madsen - Litchfield MN, US
Arun S. Kumar - Hutchinson MN, US

Assignee:

Hutchinson Technology Incorporated - Hutchinson MN

International Classification:

G11B 5/127
H04R 31/00

US Classification:

2960306, 2960303, 2960307, 205119, 205122, 216 39, 216 65, 3602345, 3602442, 3602448, 3602452, 3602454

Abstract:

A method for de-tabbing a dielectric tab extending between and bonded to first and second stainless steel portions of a disk drive head suspension component. Exemplary first and second stainless steel portions are a flexure base region and a flexure tongue. The method includes applying laser energy to the dielectric tab. The laser energy is characterized by one or more parameters, e. g. , a pulse width and/or an energy density, causing de-bonding of the dielectric tab from the first and second stainless steel portions.

US Patent:

20160372989, Dec 22, 2016

Filed:

Jun 15, 2016

Appl. No.:

15/183430

Inventors:

- Hamel MN, US
Igor Glikin - Plymouth MN, US
Jeremy Forbord - Mound MN, US
Gary W. Rosengren - Brookyn Park MN, US
Lucas Keranen - Orono MN, US

International Classification:

H02K 7/06
H02K 7/00
H02K 7/102
H02K 11/20
E21B 21/10
H02K 7/116

Abstract:

A compact, axially aligned brushless servo motor actuation unit configured to manipulate a choke valve to control the pressure within a borehole during managed pressure drilling. The actuation unit including a brushless servo, a gear reduction assembly and a planetary roller actuator substantially aligned along a longitudinal axis and housed within a tubular housing, the gear reduction assembly defining a hollow core sized to enable a portion of a roller screw of the planetary roller actuator to pass therethrough for the purpose of reducing the overall length of the actuation unit along the longitudinal axis.

US Patent:

20150185117, Jul 2, 2015

Filed:

Mar 14, 2013

Appl. No.:

14/407783

Inventors:

- Eden Prairie MN, US
Ude D. Hangen - Aachen, DE
Lucas Paul Keranen - Hutchinson MN, US
Ryan Major - Plymouth MN, US
Yunje Oh - Medina MN, US
Jeremiah Vieregge - Eden Prairie MN, US
Christopher David Young - Excelsior MN, US

Assignee:

Hysitron, Inc. - Eden Prairie MN

International Classification:

G01N 1/28
G01N 1/44
G01N 19/00
F28F 9/26
G01N 27/14

Abstract:

An environmental conditioning assembly for use in mechanical testing at scales of microns or less. The assembly includes an enclosure housing with an environmental cavity therein. A sample stage is positioned within the environmental cavity and includes an option sample heater. The enclosure housing includes a cavity perimeter clustered around the sample stage, and the enclosure housing isolates the environmental cavity and the sample stage from an environment exterior to the enclosure housing. In an example, an expansion and contraction linkage maintains a sample on the sample stage at a static elevation according to heating or cooling fluctuations within the environmental cavity. A testing instrument access port extends through the enclosure housing into the environmental cavity.

US Patent:

20140293293, Oct 2, 2014

Filed:

Feb 10, 2012

Appl. No.:

13/984250

Inventors:

David James Vodnick - Prior Lake MN, US
Arpit Dwivedi - Chanhassen MN, US
Lucas Paul Keranen - Hutchinson MN, US
Michael David Okerlund - Minneapolis MN, US
Roger William Schmitz - Hutchinson MN, US
Oden Lee Warren - New Brighton MN, US
Christopher David Young - Excelsior MN, US

Assignee:

Hysitron, Inc. - Eden Prairie MN

International Classification:

G01B 11/27
G01N 19/00

US Classification:

356614, 33533

Abstract:

An automated testing system includes systems and methods to facilitate inline production testing of samples at a micro (multiple microns) or less scale with a mechanical testing instrument. In an example, the system includes a probe changing assembly for coupling and decoupling a probe of the instrument. The probe changing assembly includes a probe change unit configured to grasp one of a plurality of probes in a probe magazine and couple one of the probes with an instrument probe receptacle. An actuator is coupled with the probe change unit, and the actuator is configured to move and align the probe change unit with the probe magazine and the instrument probe receptacle. In another example, the automated testing system includes a multiple degree of freedom stage for aligning a sample testing location with the instrument. The stage includes a sample stage and a stage actuator assembly including translational and rotational actuators.