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Helen K Muterspaugh

age ~78

from Poulsbo, WA

Also known as:
  • Helen L Muterspaugh
Phone and address:
2100 Miss Ellis Loop NE, Breidablick, WA 98370

Helen Muterspaugh Phones & Addresses

  • 2100 Miss Ellis Loop NE, Poulsbo, WA 98370
  • Tucson, AZ
  • Colorado Springs, CO

Us Patents

  • System And Method For Application Control In Measurement Devices

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  • US Patent:
    20040012382, Jan 22, 2004
  • Filed:
    Jul 17, 2002
  • Appl. No.:
    10/196913
  • Inventors:
    Michael Fender - Colorado Springs CO, US
    Gerald Kinsley - Colorado Springs CO, US
    Helen Muterspaugh - Colorado Springs CO, US
  • International Classification:
    G01R023/00
    G01R013/20
  • US Classification:
    324/12100R, 324/076190
  • Abstract:
    A system and method for application control in measurement devices is disclosed. The method includes installing a new application using the device's graphical user interface, extending the device's menu system for the new application, launching the new application using the device's extended menu system, and controlling the device using the new application through a remote control mechanism of the device. A system of application control in a measurement device is also disclosed.
  • System And Method For Application Control In Measurement Devices

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  • US Patent:
    20060123350, Jun 8, 2006
  • Filed:
    Dec 15, 2005
  • Appl. No.:
    11/300701
  • Inventors:
    Michael Fender - Colorado Springs CO, US
    Gerald Kinsley - Colorado Springs CO, US
    Helen Muterspaugh - Colorado Springs CO, US
  • International Classification:
    G06F 3/00
  • US Classification:
    715764000
  • Abstract:
    A system and method for application control in measurement devices is disclosed. The method includes installing a new application using the device's graphical user interface, extending the device's menu system for the new application, launching the new application using the device's extended menu system, and controlling the device using the new application through a remote control mechanism of the device. A system of application control in a measurement device is also disclosed.

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