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Us Patents
Probe Card And Temperature Stabilizer For Testing Semiconductor Devices
Adolphus McClanahan - Garland TX, US John Wolfe - Celina TX, US Michael Harris - Garland TX, US Frank Mesa - Murphy TX, US
Assignee:
Texas Instruments Incorporated - Dallas TX
International Classification:
G01R 31/02
US Classification:
324754000
Abstract:
One aspect of the invention provides an apparatus that includes a probe card having probe needles associated therewith. A temperature stabilizer element is couplable to the probe card. The temperature stabilizer is configured to either raise or lower a temperature of the probe needles to reduce movement of the probe needles.
Probe Card And Temperature Stabilizer For Testing Semiconductor Devices
Adolphus E. MCCLANAHAN - Garland TX, US John D. WOLFE - Celina TX, US Michael P. HARRIS - Garland TX, US Frank J. MESA - Murphy TX, US
Assignee:
Texas Instruments Incorporated - Dallas TX
International Classification:
G01R 31/02 G01R 31/26
US Classification:
324760
Abstract:
One aspect of the invention provides an apparatus that includes a probe card [ having probe needles [ associated therewith. A temperature stabilizer element [ is couplable to the probe card [. The temperature stabilizer [ is configured to either raise or lower a temperature of the probe needles [ to reduce movement of the probe needles [
Monroe Elementary School Everett WA 1962-1965, Garfield Elementary School Garfield WA 1965-1966, Longfellow Elementary School Everett WA 1967-1968, North Junior High School Everett WA 1969-1970