Don Dimarzio from Northport, NY, age 65

Us Patents

Thermoplastic Coating For Composite Structures
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US Patent:

6974606, Dec 13, 2005
Filed:

May 23, 2003
Appl. No.:

10/444784
Inventors:

Don DiMarzio - Northport NY, US
Charles Weizenecker - Stony Brook NY, US
Steve Chu - Ronkonkoma NY, US
Dom Anton - Smithtown NY, US
Assignee:

Northrop Grumman Corporation - Los Angeles CA
International Classification:

C23C004/02
C23C004/04
US Classification:

427447, 427318, 427314, 4274071, 427409
Abstract:

A method of thermoplastic coating composite structures includes heating a tool. A thermoplastic layer is deposited onto the heated tool by thermal spraying a thermoplastic on the heated tool. Composite material is applied onto the thermoplastic layer. The thermoplastic layer and the composite material are then cured.

System And Method For Imaging Of Coated Substrates
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US Patent:

7193215, Mar 20, 2007
Filed:

Aug 25, 2005
Appl. No.:

11/211304
Inventors:

Don DiMarzio - Northport NY, US
Robert Silberstein - New York NY, US
John Weir - Huntington NY, US
Assignee:

Northrop Grumman Corporation - Los Angeles CA
International Classification:

G01N 21/35
US Classification:

2503418, 25033911
Abstract:

The present invention relates to a system for imaging the surface of a substrate through a coating on the substrate. The system includes an infrared light source positioned to cast an infrared light upon the substrate to thereby create reflected light. A focal plane array may be positioned to receive the reflected light and generate an image therefrom. At least one optical filter may be disposed between the substrate and the focal plane array so as to pass only coating transparent wavelengths of the reflected light along an optical path between the infrared light source and the focal plane array thereby visually revealing irregular structural features of the substrate as at least one image.

System And Method For Imaging Of Coated Substrates
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US Patent:

20040026622, Feb 12, 2004
Filed:

Aug 6, 2002
Appl. No.:

10/213599
Inventors:

Don DiMarzio - Northport NY, US
Robert Silberstein - New York NY, US
John Weir - Huntington NY, US
International Classification:

G01N021/35
US Classification:

250/341800, 250/339110
Abstract:

The present invention relates to a system for imaging the surface of a substrate through a coating on the substrate. The system includes an infrared light source positioned to cast an infrared light upon the substrate to thereby create reflected light. A focal plane array may be positioned to receive the reflected light and generate an image therefrom. At least one optical filter may be disposed between the substrate and the focal plane array so as to pass only coating transparent wavelengths of the reflected light along an optical path between the infrared light source and the focal plane array thereby visually revealing irregular structural features of the substrate as at least one image.

Method Of Multi-Axial Crystalline Thermoplastic Coating Of Composite Structures
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US Patent:

20040234707, Nov 25, 2004
Filed:

May 23, 2003
Appl. No.:

10/445238
Inventors:

Don DiMarzio - Northport NY, US
Charles Weizenecker - Stony Brook NY, US
Steve Chu - Ronkonkoma NY, US
Dom Anton - Smithtown NY, US
International Classification:

B32B027/00
US Classification:

428/001530, 428/421000
Abstract:

A method for thermoplastic coating composite structures includes applying a crystalline crystalline multi-axially oriented thermoplastic layer onto a working surface of a tool. A layer of composite material is applied onto the crystalline crystalline multi-axially oriented thermoplastic layer, and the crystalline crystalline multi-axially oriented thermoplastic layer and the layer of composite material are cocured at a specific temperature and pressure in an autoclave. The softening temperature of the crystalline crystalline multi-axially oriented thermoplastic layer is not substantially greater than the curing temperature of the composite material.

Method Of Multi-Axial Crystalline Thermoplastic Coating Of Composite Structures
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US Patent:

20050181181, Aug 18, 2005
Filed:

Oct 1, 2004
Appl. No.:

10/957233
Inventors:

Don DiMarzio - Northport NY, US
Charles Weizenecker - Stony Brook NY, US
Steve Chu - Ronkonkoma NY, US
Dom Anton - Smithtown NY, US
International Classification:

B32B001/00
US Classification:

428174000
Abstract:

A method for thermoplastic coating composite structures includes applying a crystalline crystalline multi-axially oriented thermoplastic layer onto a working surface of a tool. A layer of composite material is applied onto the crystalline crystalline multi-axially oriented thermoplastic layer, and the crystalline crystalline multi-axially oriented thermoplastic layer and the layer of composite material are cocured at a specific temperature and pressure in an autoclave. The softening temperature of the crystalline crystalline multi-axially oriented thermoplastic layer is not substantially greater than the curing temperature of the composite material.

Method Of Multi-Axial Crystalline Thermoplastic Coating Of Composite Structures
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US Patent:

20070170618, Jul 26, 2007
Filed:

Apr 3, 2007
Appl. No.:

11/695922
Inventors:

Don DiMarzio - Northport NY, US
Charles Weizenecker - Stony Brook NY, US
Steve Chu - Ronkonkoma NY, US
Dom Anton - Smithtown NY, US
Assignee:

Northrop Grumman Corporation - Los Angeles CA
International Classification:

B29C 43/02
US Classification:

264319000
Abstract:

A method for thermoplastic coating composite structures includes applying a crystalline crystalline multi-axially oriented thermoplastic layer onto a working surface of a tool. A layer of composite material is applied onto the crystalline crystalline multi-axially oriented thermoplastic layer, and the crystalline crystalline multi-axially oriented thermoplastic layer and the layer of composite material are cocured at a specific temperature and pressure in an autoclave. The softening temperature of the crystalline crystalline multi-axially oriented thermoplastic layer is not substantially greater than the curing temperature of the composite material.

Method Of Spectral Nondestructive Evaluation
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US Patent:

61845280, Feb 6, 2001
Filed:

Aug 27, 1998
Appl. No.:

9/140986
Inventors:

Don DiMarzio - Northport NY
Louis Gregory Casagrande - Malvern NY
James A. Clarke - Greenlawn NY
Robert P. Silberstein - New York NY
Assignee:

Vought Aircraft Industries, Inc. - Dallas TX
International Classification:

G01N 2147
G01N 2155
US Classification:

25033908
Abstract:

In accordance with the present invention, there is provided a spectral nondestructive method for evaluating substrate surface characteristics of a sample substrate. The sample substrate has a sample substrate surface and a generally visually nontransmissive sample coating disposed on the sample substrate surface. The sample coating is transmissive within a first infrared spectral wavelength range and the sample substrate is reflective within the first infrared spectral wavelength range. The method begins with directing infrared radiation from an infrared radiation source towards the coated sample substrate. Specular and diffuse infrared radiation reflected from the coated sample substrate is collected. The reflected radiation is measured as a function of wavelength in the first infrared spectral wavelength range to obtain measured reflectance data representative of the reflectance of the coated sample substrate. The measured reflectance data is compared to reference reflectance data representative of a sample substrate surface having a known physical characteristic within the first wavelength range to obtain differential data.

Apparatus For Exposing An Adjustable Area Of A Film
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US Patent:

56317220, May 20, 1997
Filed:

Dec 28, 1994
Appl. No.:

8/365090
Inventors:

Edward V. Sullivan - Huntington Station NY
Don DiMarzio - Northport NY
Assignee:

Grumman Aerospace Corporation - Los Angeles CA
International Classification:

G03B 2728
G03B 4204
US Classification:

355 74
Abstract:

Apparatus for exposing a selected area of a film, and comprising a holding assembly for holding a film, and a first support assembly connected to and supporting the holding assembly. The apparatus further comprises an exposure area control assembly located adjacent the holding assembly and forming an adjustable opening to expose a selected area of the film, and a second support assembly connected to and supporting the exposure area control assembly. Preferably, the first support assembly supports the film assembly for movement upward and downward and forward and rearward, and for pivotal movement about horizontal and vertical axes. Also, the second support assembly supports the exposure area control assembly for forward and rearward movement, and for pivotal movement about horizontal and vertical axes. In addition, in a preferred embodiment, the exposure area control assembly includes a frame and a multitude of slats supported by the frame, and these slats may be moved to vary the size, shape, and position of the adjustable opening formed by that control assembly. A preferred embodiment of the invention described herein in detail is very well suited for seamless topographic imaging large single crystal wafers, and in particular, for controlling the area of an x-ray film that is exposed when x-rays are scanned across a single crystal wafer to produce an x-ray topograph of the wafer.