David J Vodnick

US Patent:

7628065, Dec 8, 2009

Filed:

Dec 22, 2005

Appl. No.:

11/316456

Inventors:

Dehua Yang - Savage MN, US
David J. Vodnick - Eden Prairie MN, US
Richard J. Nay - Shorewood MN, US
Thomas J. Wyrobek - Edina MN, US

Assignee:

Hysitron, Inc. - Minneapolis MN

International Classification:

G01N 3/48
G01N 19/04

US Classification:

73150A, 73 81, 73 82, 73 83

Abstract:

A method for measuring toughness of interfacial adhesion including applying a normal force with a probe to a surface of a coating joined to a major surface of a substrate, wherein the surface is substantially parallel to the major surface, and applying a lateral force to the coating with the probe by laterally moving a position of the probe relative to the major surface such that the probe forms at least one delaminated region in the coating as the position of the probe moves laterally across the major surface, the delaminated region having a starting point and an ending point. The method further includes measuring a magnitude of the lateral force over time, and determining a toughness of interfacial adhesion between the coating and the major surface based on changes in magnitude of the lateral force as the position of the probe moves from the starting point to ending point.

US Patent:

20060137468, Jun 29, 2006

Filed:

Dec 22, 2005

Appl. No.:

11/316142

Inventors:

Dehua Yang - Savage MN, US
David Vodnick - Eden Prairie MN, US
Richard Nay - Shorewood MN, US
Thomas Wyrobek - Edina MN, US

International Classification:

G01N 3/08

US Classification:

073827000

Abstract:

A method for measuring toughness of interfacial adhesion including applying a normal force with a probe to a surface of a coating joined to a major surface of a substrate of an electronic structure, wherein the surface is substantially parallel to the major surface, and applying a lateral force to the coating with the probe by laterally moving a position of the probe relative to the major surface such that the probe forms at least one delaminated region in the coating as the position of the probe moves laterally across the major surface, the delaminated region having a starting point and an ending point. The method further includes measuring a magnitude of the lateral force over time, and determining a toughness of interfacial adhesion between the coating and the major surface based on changes in magnitude of the lateral force as the position of the probe moves from the starting point to ending point.

US Patent:

20060137469, Jun 29, 2006

Filed:

Dec 22, 2005

Appl. No.:

11/316471

Inventors:

Dehua Yang - Savage MN, US
David Vodnick - Eden Prairie MN, US
Richard Nay - Shorewood MN, US
Thomas Wyrobek - Edina MN, US

International Classification:

G01N 3/08

US Classification:

073827000

Abstract:

A method for measuring toughness of interfacial adhesion including applying a normal force with a probe to a surface of a coating joined to a major surface of a substrate of a medical device, wherein the surface is substantially parallel to the major surface, and applying a lateral force to the coating with the probe by laterally moving a position of the probe relative to the major surface such that the probe forms at least one delaminated region in the coating as the position of the probe moves laterally across the major surface, the delaminated region having a starting point and an ending point. The method further includes measuring a magnitude of the lateral force over time, and determining a toughness of interfacial adhesion between the coating and the major surface based on changes in magnitude of the lateral force as the position of the probe moves from the starting point to ending point.

US Patent:

20060191327, Aug 31, 2006

Filed:

Dec 22, 2005

Appl. No.:

11/316143

Inventors:

Dehua Yang - Savage MN, US
David Vodnick - Eden Prairie MN, US
Richard Nay - Shorewood MN, US
Thomas Wyrobek - Edina MN, US

International Classification:

G01N 3/48

US Classification:

073081000

Abstract:

A method for measuring toughness of interfacial adhesion including applying a normal force with a probe to a surface of a coating joined to a major surface of a substrate of a medical stent, wherein the surface is substantially parallel to the major surface, and applying a lateral force to the coating with the probe by laterally moving a position of the probe relative to the major surface such that the probe forms at least one delaminated region in the coating as the position of the probe moves laterally across the major surface, the delaminated region having a starting point and an ending point. The method further includes measuring a magnitude of the lateral force over time, and determining a toughness of interfacial adhesion between the coating and the major surface based on changes in magnitude of the lateral force as the position of the probe moves from the starting point to ending point.

US Patent:

20140293293, Oct 2, 2014

Filed:

Feb 10, 2012

Appl. No.:

13/984250

Inventors:

David James Vodnick - Prior Lake MN, US
Arpit Dwivedi - Chanhassen MN, US
Lucas Paul Keranen - Hutchinson MN, US
Michael David Okerlund - Minneapolis MN, US
Roger William Schmitz - Hutchinson MN, US
Oden Lee Warren - New Brighton MN, US
Christopher David Young - Excelsior MN, US

Assignee:

Hysitron, Inc. - Eden Prairie MN

International Classification:

G01B 11/27
G01N 19/00

US Classification:

356614, 33533

Abstract:

An automated testing system includes systems and methods to facilitate inline production testing of samples at a micro (multiple microns) or less scale with a mechanical testing instrument. In an example, the system includes a probe changing assembly for coupling and decoupling a probe of the instrument. The probe changing assembly includes a probe change unit configured to grasp one of a plurality of probes in a probe magazine and couple one of the probes with an instrument probe receptacle. An actuator is coupled with the probe change unit, and the actuator is configured to move and align the probe change unit with the probe magazine and the instrument probe receptacle. In another example, the automated testing system includes a multiple degree of freedom stage for aligning a sample testing location with the instrument. The stage includes a sample stage and a stage actuator assembly including translational and rotational actuators.