Casey P Hare

US Patent:

6951130, Oct 4, 2005

Filed:

Dec 17, 2004

Appl. No.:

11/015945

Inventors:

Casey Patrick Hare - Santa Barbara CA, US
Andrew Norman Erickson - Santa Barbara CA, US

Assignee:

Multiprobe, Inc. - Santa Barbara CA

International Classification:

H01J003/14

US Classification:

73105, 250307, 250306

Abstract:

A method and apparatus for scanning multiple scanning probe microscopes in close proximity, to scan overlapping scan areas at the same time while avoiding collision employs a control system providing drive signals to a first Atomic Force Microscope (AFM) and calculated drive signals to additional AFMs based on the first drive signals and the relative position of the additional AFMs to the first AFM for consistent spaced motion. Scanning and Failure Analysis (FA) probing of multiple feature of interest using multiple APMs allows for reduced time for locating FA features to set up measurements.

US Patent:

7415868, Aug 26, 2008

Filed:

Mar 20, 2006

Appl. No.:

11/385102

Inventors:

Casey Patrick Hare - Santa Barbara CA, US
Andrew Norman Erickson - Santa Barbara CA, US

Assignee:

Multiprobe, Inc. - Santa Barbara CA

International Classification:

G01B 5/28

US Classification:

73105, 250306, 250307

Abstract:

The present invention comprises an apparatus and a method for using multiple scanning probes to deconvolve tip artifacts in scanning probe microscopes and other scanning probe systems. The invention uses multiple scanning probe tips of different geometries or orientations to scan a feature, such as a semiconductor line or trench, and to display the scan data such that tip artifacts from each tip can be omitted from the measurement by data from the other tips.

US Patent:

7444857, Nov 4, 2008

Filed:

Sep 29, 2005

Appl. No.:

11/240090

Inventors:

Casey Patrick Hare - Santa Barbara CA, US
Andrew Norman Erickson - Santa Barbara CA, US

Assignee:

Multiprobe, Inc. - Santa Barbara CA

International Classification:

G01B 5/28

US Classification:

73105, 250306, 250307

Abstract:

A method and apparatus for scanning multiple scanning probe microscopes in close proximity, to scan overlapping scan areas at the same time while avoiding collision employs a control system providing drive signals to a first Atomic Force Microscope (AFM) and calculated drive signals to additional AFMs based on the first drive signals and the relative position of the additional AFMs to the first AFM for consistent spaced motion. Scanning and Failure Analysis (FA) probing of multiple feature of interest using multiple APMs allows for reduced time for locating FA features to set up measurements.

US Patent:

20040025578, Feb 12, 2004

Filed:

Jul 7, 2003

Appl. No.:

10/615223

Inventors:

Casey Hare - Santa Barbara CA, US
Andrew Erickson - Santa Barbara CA, US

International Classification:

G01N013/16

US Classification:

073/105000

Abstract:

A method and apparatus for scanning multiple scanning probe microscopes in close proximity, to scan overlapping scan areas at the same time while avoiding collision employs a control system providing drive signals to a first Atomic Force Microscope (AFM) and calculated drive signals to additional AFMs based on the first drive signals and the relative position of the additional AFMs to the first AFM for consistent spaced motion. Scanning and Failure Analysis (FA) probing of multiple feature of interest using multiple APMs allows for reduced time for locating FA features to set up measurements.

US Patent:

20120225493, Sep 6, 2012

Filed:

Aug 17, 2010

Appl. No.:

13/390664

Inventors:

Brian D. Piorek - Santa Barbara CA, US
Carl D. Meinhart - Santa Barbara CA, US
Seung Joon Lee - Santa Barbara CA, US
Casey Hare - Santa Barbara CA, US
Norman Douglas Bradley - Santa Barbara CA, US

Assignee:

SpectraFluidics, Inc. - Goleta CA

International Classification:

G01J 3/28
G01J 3/44
G01N 33/53
H01J 49/26

US Classification:

436501, 25033901, 250281, 250372, 250282, 356301, 356402, 422 69

Abstract:

A series of electronic-chemometric control processes to enhance the selectivity, concentration, analysis, and detec tion of chemical species (analytes) in the gas phase, such as when using SERS-based techniques. Controls consist variously of: 1) feedback of electronic signals corresponding to changes of static and variable parameters in targeted chemical species that vary according to a reduction, increase, maximization, linearization, or improved confidence in one or more chemometric output parameters; 2) methods for spatially locating the source of an analyte species; and, 3) variable duty cycling to save power and materials according to altered physical and environmental conditions within a monitored zone.

US Patent:

20120236304, Sep 20, 2012

Filed:

Oct 14, 2010

Appl. No.:

13/501716

Inventors:

Seung Joon Lee - Santa Barbara CA, US
Brian D. Piorek - Santa Barbara CA, US
Carl D. Meinhart - Santa Barbara CA, US
Casey Hare - Santa Barbara CA, US
Norman Douglas Bradley - Santa Barbara CA, US

Assignee:

SpectraFuidics, Inc. - Goleta CA

International Classification:

G01N 21/65

US Classification:

356301

Abstract:

Solid-type SERS-active substrates (e.g., noble metallic nanostructured powders or noble metallic nanoparticle-coatings on beads, microbeads, particles, etc.) are contained within optically-transparent modules. The modules allow for the controlled introduction of analyte-bearing fluid(s) into SERS-active substrates. The modules also allow for the monitoring of SERS signals emanating from analyte(s) which have accumulated on the confined SERS-active substrates. These SERS signals may be monitored over time by direct readout of the SERS substrates through the optically transparent module for chemical analysis and chemical detection applications.

US Patent:

20180309404, Oct 25, 2018

Filed:

Apr 24, 2017

Appl. No.:

15/495845

Inventors:

Casey Patrick Hare - Santa Barbara CA, US

Assignee:

Angstrom Designs, Inc. - Santa Barbara CA

International Classification:

H02S 50/15
F21S 8/00

Abstract:

A test apparatus for analyzing performance of a multi-junction solar cell can include a plurality of light source groups, each light source group including three or more light sources distributed over a substrate. Each sub-cell of the solar cell is associated with at least one of the light source groups, and each light source group primarily photoexcites the sub-cell of the light source group with which it is associated. The intensities of the various light source groups can are adjusted such that an output current of each of a plurality of calibration standards is within 2% of a predetermined current value. The test apparatus can then be used to test performance of the multi-junction solar cell.