Bruce Alan Huling

US Patent:

7397120, Jul 8, 2008

Filed:

Dec 20, 2005

Appl. No.:

11/311824

Inventors:

Stephen St. Germain - Scottsdale AZ, US
Francis J. Carney - Queen Creek AZ, US
Bruce Alan Huling - Buckeye AZ, US

Assignee:

Semiconductor Components Industries, L.L.C. - Phoenix AZ

International Classification:

H01L 23/538

US Classification:

257727, 257177, 257686, 257777, 257E23178

Abstract:

In one embodiment, a semiconductor package structure includes a plurality of upright clips having ends with mounting surfaces for vertically mounting the package to a next level of assembly. A semiconductor chip is interposed between the upright clips together with one or more spacers.

US Patent:

20080111227, May 15, 2008

Filed:

Jan 22, 2008

Appl. No.:

12/017856

Inventors:

Stephen St. Germain - Scottsdale AZ, US
Farncis Carney - Queen Creek AZ, US
Bruce Huling - Buckeye AZ, US

International Classification:

H01L 23/02
H01L 21/00

US Classification:

257686000, 438109000, 257692000, 257E23086

Abstract:

In one embodiment, a semiconductor package structure includes a plurality of upright clips having ends with mounting surfaces for vertically mounting the package to a next level of assembly. A semiconductor chip is interposed between the upright clips together with one or more spacers.

US Patent:

46037071, Aug 5, 1986

Filed:

Aug 2, 1983

Appl. No.:

6/519639

Inventors:

Roger J. Gregoire - Phoenix AZ
Bruce Huling - Phoenix AZ

Assignee:

Motorola, Inc. - Schaumburg IL

International Classification:

F16K 3700

US Classification:

137557

Abstract:

IA purge block is disclosed in which inlet, process, purge and vent ports are series connected in a ring or bridge. The channel or passageway connecting the inlet and purge ports comprises a flow sensor. The impedance to gas flow of each channel is different from the others. The impedances are chosen such that improper operating conditions cause an imbalance in the flow which is detected by the flow sensor. During normal operation of the system in which the purge block is used, the flow sensor acts as an excess flow detector by comparing the flow through itself with the flow through a parallel, but more restrictive, path within the purge block.

US Patent:

57140111, Feb 3, 1998

Filed:

Feb 17, 1995

Appl. No.:

8/390716

Inventors:

Charles Anthony Schneider - Gilbert AZ
Ronald James Gibson - Chandler AZ
Bruce Alan Huling - Buckeye AZ
George Martin Engle - Scottsdale AZ

Assignee:

Air Products and Chemicals Inc. - Allentown PA
Aspect Systems Inc. - Chandler AZ
GEC Inc. - Tempe AZ

International Classification:

B08B 500
B08B 502
B08B 504

US Classification:

134 21

Abstract:

A method for the dynamic cleaning of semiconductor fabrication equipment and particularly quartzware with thermally activated diluted nitrogen trifluoride at elevated temperatures, typically at the process operation temperature, wherein the cleaning effluent is safely removed and cleaning by-products isolated or diluted to provide for efficient cleaning and rapid restarts of fabrication equipment so cleaned.

US Patent:

57971951, Aug 25, 1998

Filed:

Feb 17, 1995

Appl. No.:

8/390612

Inventors:

Bruce Alan Huling - Phoenix AZ
Charles Anthony Schneider - Gilbert AZ
George Martin Engle - Scottsdale AZ

Assignee:

Air Products and Chemicals, Inc. - Allentown PA
GEC, Inc. - Tempe AZ

International Classification:

F26B 504

US Classification:

34404

Abstract:

The present invention is a method and apparatus for the dynamic cleaning of semiconductor fabrication equipment and particularly quartzware with thermally activated nitrogen trifluoride wherein the cleaning effluent is safely removed and cleaning by-products isolated or diluted to provide for efficient cleaning and rapid restarts of fabrication equipment so cleaned.